Like all scanning probe microscopes, AFM is susceptible to instrument 'crosstalk', or background signals that can mask the true atomic force measurement of interest and create misleading results. For the first time, researchers offer a new, easy-to-implement approach to overcoming crosstalk challenges in VM-AFM measurements.
Tuesday, December 10, 2019
Pushing the precision of nanoscale mapping
Like all scanning probe microscopes, AFM is susceptible to instrument 'crosstalk', or background signals that can mask the true atomic force measurement of interest and create misleading results. For the first time, researchers offer a new, easy-to-implement approach to overcoming crosstalk challenges in VM-AFM measurements.
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