Watching the evolution of nanostructures in thin films
Scientists have found a way to turn X-ray fluorescence into an ultra-high position-sensitive probe to measure internal nanostructures in thin films that can be a hundred times finer than a human hair.
Scientists have found a way to turn X-ray fluorescence into an ultra-high position-sensitive probe to measure internal nanostructures in thin films that can be a hundred times finer than a human hair.
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