A valence electron in titanium oxide has been imaged at a resolution of 0.2 Angstroms using synchrotron X-ray diffraction and a new Fourier synthesis method that can determine the orbital states in materials regardless of their physical properties.
Wednesday, October 28, 2020
Direct observation of a single electron's butterfly-shaped distribution in titanium oxide
A valence electron in titanium oxide has been imaged at a resolution of 0.2 Angstroms using synchrotron X-ray diffraction and a new Fourier synthesis method that can determine the orbital states in materials regardless of their physical properties.
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